Category:
Materials Science
,
Working Paper
, Title:
Direct Epitaxial Nanometer-Thin InN of High Structural Quality on 4H-SiC by Atomic Layer Deposition
, Authors:
Chih-Wei Hsu, Petro Deminskyi, Ivan Martinovic, Ivan G. Ivanov, Justinas Palisaitis, Henrik Pedersen
Version 2 posted 13 July 2020
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