Category:
Materials Science
,
Working Paper
, Title:
Tapered Cross-Section Photoelectron Spectroscopy Provides Insights into the Buried Interfaces of III-V Semiconductor Devices
, Authors:
Clément Maheu, Mohammad Amin Zare Pour, Iban Damestoy, David Ostheimer, Maximilian Mellin, Dominik C. Moritz, Agnieszka Paszuk, Wolfram Jaegermann, Thomas Mayer, Thomas Hannappel, Jan Philipp Hofmann
Version 2 posted 26 July 2022
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