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Kelvin probe force microscopy

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1 results in Keywords: Kelvin probe force microscopy

Materials Science

Printed Silver Electrode for Silicon-based Schottky Barrier Diode: High Rectification Ratio Enabled by Ag/p-Si Interface Exceeds Theoretical Barrier Height

Masashi Saitoh, Toshiyuki Tamai

Version 1 posted 03 December 2020

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