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Thomas M. M. Heenan

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Chemical Engineering and Industrial Chemistry

Direct 4D Observations of Electrochemically Induced Intergranular Cracking in NMC811 Particles

Huw C. W. Parks, Adam M. Boyce, Aaron Wade, Thomas M. M. Heenan, Chun Tan, Emilio Martínez-Pañeda, Paul R. Shearing, Dan J. L. Brett, Rhodri Jervis

Version 2 posted 27 January 2023

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