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Hamish Reid

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Chemical Engineering and Industrial Chemistry

Non-Linear Damage Response to Voltage Revealed by Operando X-ray Tomography in Polycrystalline NMC811

Huw Parks, Matthew Jones, Aaron Wade, Alice Llewellyn, Chun Tan, Hamish Reid, Ralf Ziesche, Thomas Heenan, Shashidhara Marathe, Christoph Rau, Paul Shearing, Rhodri Jervis

Version 4 posted 22 January 2025

851

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Demonstrating faster multi-label grey-level analysis for crack detection in ex-situ & operando micro-CT images of NMC electrode

Matthew Jones, Huw Parks, Alice Llewellyn, Hamish Reid, Chun Tan, Aaron Wade, Tom Heenan, Francesco Iacoviello, Shashidhara Marathe, Paul Shearing, Rhodri Jervis

Version 1 posted 24 December 2024

209

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