Category:
Materials Science
,
Working Paper
, Title:
Machine Learning for Microscopy Data Analysis: Toward Real-time Optical and Electrical Characterization of Sub-micron Materials
, Authors:
Amitrajit Mukherjee, Robby Reynaerts, Bapi Pradhan, Sudipta Seth, Andreas T. Rösch, Tamali Banerjee, Lata Chouhan, Handong Jin, Christian Sternemann, Michael Paulus, Luca Leoncino, Kunal S. Mali, Steven De Feyter, Maarten Roeffaers, Egbert Willem Meijer, Johan Hofkens, Elke Debroye
Version 1 posted 17 September 2024
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