Abstract
Using in-situ scanning transmission electron microscopy (STEM) and low-loss plasmon electron energy-loss spectroscopy (EELS), we reveal asymmetric transformation mechanisms during the hydrogenation and dehydrogenation of Mg thin films. Remarkably, during hydrogenation, the MgH₂ phase can nucleate from either the bottom or top interface of a Mg thin film while symmetrically sandwiched between two Ti layers. This unexpected behavior, occurring under identical external conditions, highlights the critical role of nucleation barriers in the phase transformation process, challenging conventional diffusion-driven paradigms. In contrast, dehydrogenation proceeds exclusively via an H₂ diffusion-controlled frontal growth originating from the top interface. These insights underscore the importance of understanding metal-to-metal hydride phase transformations for advancing hydrogen storage technologies and applications such as hydrogen sensing.
Supplementary materials
Title
Unraveling Real-Time Dynamics in Mg-to-MgH₂ Phase Transformation Using In-Situ Electron Microscopy
Description
Experimental methods, including thin film synthesis and XRD characterization,
TEM sample preparation, hydrogenation/dehydrogenation, low loss EELS mapping, the influence of electron beam on EELS analysis, Intensity gradient in EELS mapping, dehydrogenation, and COMSOL simulation (PDF)
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