New Isostructural Family of Mixed-Metal Na-M(III)-MOFs Based on Glycolic Acid

11 November 2024, Version 1
This content is a preprint and has not undergone peer review at the time of posting.

Abstract

A series of new isostructural metal–organic frameworks based on trivalent metal ions (Al, Fe, Ga), Na+ ions and glycolate ions as the linker molecules, denoted as M-CAU-64, with the framework composition [M(III)Na(H2O)2(C2H2O3)2] · x H2O were obtained using high-throughput methods. The crystal structures of the title compounds were determined from single crystal or powder X-ray diffraction data. Thermogravimetric analyses indicate a thermal stability up to 340 °C for Ga-CAU-64, while variable temperature powder X-ray diffraction (VT-PXRD) revealed various structural changes including phase transformations and a rearrangement of the inorganic building unit of CAU-64, associated with the loss of adsorbed water molecules upon thermal treatment. Water sorption measurements confirmed the porosity of the CAU-64 compounds and sorption capacities up to 360 mg/g were found. Furthermore, the synthesis of multivariate MOFs (Alx-Fe1-x-CAU-64) enabled the fine-tuning of both thermal stability and sorption characteristics.

Keywords

Metal-organic Frameworks
Adsorption
Synthesis
High-throughput methods
Glycolic acid

Supplementary materials

Title
Description
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Title
Supporting Information (SI)
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Supporting Information (SI) containing additional data
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Title
Al-CAU-64_Rietveld (cif)
Description
Al-CAU-64 (cif); crystallographic data for Al-CAU-64 obtained by Rietveld-Refinement against powder X-ray diffraction data
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Title
Fe-CAU-64_Rietveld (cif)
Description
Fe-CAU-64 (cif); crystallographic data for Fe-CAU-64 obtained by Rietveld-Refinement against powder X-ray diffraction data
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Ga-CAU-64_Rietveld (cif)
Description
Ga-CAU-64 (cif); crystallographic data for Ga-CAU-64 obtained by Rietveld-Refinement against powder X-ray diffraction data
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Ga-CAU-64_act_Rietveld (cif)
Description
Ga-CAU-64_act (cif); crystallographic data for Ga-CAU-64_act obtained by Rietveld-Refinement against powder X-ray diffraction data
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