Interplay between Growth Mechanism, Materials Chemistry, and Band Gap Characteristics in Sputtered Thin Films of Chalcogenide Perovskite BaZrS3

16 August 2023, Version 1

Abstract

The prototypical chalcogenide perovskite BaZrS3, with its direct band gap, exceptionally strong light-harvesting ability and good carrier transport properties, provides fundamental prerequisites for a promising photovoltaic material. This inspired synthesis of BaZrS3 in the form of thin films, using sputtering and rapid thermal processing, aimed at device fabrication for future optoelectronic applications. Using a combination of long- and short-range structural information from x-ray absorption spectroscopy (XAS) and x-ray diffraction (XRD), we have elucidated how, starting from a random network of Ba, Zr, S atoms, thermal treatment induces crystallization and growth of BaZrS3 and explained its impact on observed PL properties. We also provide an electronic structure description and confirm the surface material chemistry using a combination of depth-dependent Photoelectron Spectroscopy (PES) using Hard X-ray (HAXPES) and traditional Al Kα radiation. From the knowledge of the optical band gap of BaZrS3 thin films, synthesized at an optimal temperature of 900°C, and our estimation of the valence band edge position with respect to the Fermi level, one may conclude that these semiconductor films are intrinsic in nature with a slight n-type character. A detailed understanding of the growth mechanism and electronic structure of BaZrS3 thin films helps pave the way for their use in photovoltaics.

Keywords

chalcogenide perovskites
BaZrS3
EXAFS
XRD
structure-property correlation

Supplementary materials

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Title
Interplay between Growth Mechanism, Materials Chemistry, and Band Gap Characteristics in Sputtered Thin Films of Chalcogenide Perovskite BaZrS3
Description
Details of data analyses for: I. X-ray Absorption Spectroscopy/Extended X-ray Absorption Fine Structure (XAS/EXAFS), II. X-ray Diffraction (XRD), III. Photoelectron Spectroscopy (conventional: XPS/ Hard X-rays: HAXPES). Figures S1 and S2: EXAFS fits to BaZrS3 thin films, Figures S3 and S4: composition analyses from PES using conventional Al Kα (1.487 eV) and hard x-rays (4.0 eV). Tables S1, S2, S3: parameters extracted from EXAFS analyses, Table S4: parameters extracted from XRD analyses, Tables S5, S6, S7, S8, S9, S10: parameters extracted from PES analyses.
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