Technical Note:  Rayleigh Scattering of Sulfur Hexafluoride at 1.066 Microns

Manish Gupta; Michael Sullivan

doi:10.26434/chemrxiv-2022-78g87

Analytical Chemistry

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Technical Note: Rayleigh Scattering of Sulfur Hexafluoride at 1.066 Microns

16 March 2022, Version 1

Working Paper

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This content is a preprint and has not undergone peer review at the time of posting.

Abstract

In this brief technical note, we measure the Rayleigh scattering of sulfur hexafluoride (SF6) at 1.066 microns using cavity ringdown spectroscopy to determine the difference in optical loss between Helium and SF6. By empirically verifying previous calculations, we provide further confidence in using SF6 as a calibration species for near-infrared scattering. The method can be readily extended to measuring other gases and wavelengths.

Keywords

Rayleigh scattering

cavity ringdown spectroscopy

SF6

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Version History

Mar 16, 2022 Version 1

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License

The content is available under CC BY NC ND 4.0

DOI

10.26434/chemrxiv-2022-78g87

Funding

Office of Naval Research

N68335-21-C-0162

Author’s competing interest statement

The author(s) have declared they have no conflict of interest with regard to this content

Ethics

The author(s) have declared ethics committee/IRB approval is not relevant to this content