Grazing-Incidence Texture Tomography of a Patterned Organic Semiconductor Film

02 March 2022, Version 1
This content is a preprint and has not undergone peer review at the time of posting.


The use of grazing-incidence scattering methods for the characterization of 2D patterned organic thin films is limited due to the elongated 1D footprint of the X-ray beam on the sample. However, this characteristic feature can be turned into an advantage, when combined with tomographic reconstruction. In this pilot study we show how the use of a chosen texture reflection and a diffuse reflectivity signal can each provide 2D images of the deposits, simultaneously revealing the organic film’s crystal orientation and the location of the metal electrodes.


organic semiconductors
organic field effect transistors
molecular orientation
x-ray scattering
x-ray reflectivity
patterned thin films


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