Abstract
Mitigation of electron-beam damage of methylammonium lead iodide (MAPbI3) using a modified laser-driven pulsed-beam TEM is demonstrated. For the same dose rates and total doses, it is shown that using a pulsed electron beam causes less damage to MAPbI3 than a conventional thermionic (random) beam. Varying electron-pulse size (i.e., number of electrons per pulse) and the time between pulses is also studied. It is found that damage increases with increasing pulse size and with decreasing time between pulses. Above a certain pulse size, more damage is caused by the pulsed beam than by conventional approaches.