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Quantitative Image Analysis of Fractal-like Thin Films of Organic Semiconductors

submitted on 04.05.2018, 19:36 and posted on 07.05.2018, 13:36 by Weikun Zhu, Erfan Mohammadi, Ying Diao
Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried out via image analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then employ this program in a case study of meniscus-guided coating of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C8-BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C8-BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms.


Email Address of Submitting Author

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University of Illinois at Urbana−Champaign


United States

ORCID For Submitting Author


Declaration of Conflict of Interest



Read the published paper

in Journal of Polymer Science Part B: Polymer Physics