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Quantitative Image Analysis of Fractal-like Thin Films of Organic Semiconductors

preprint
submitted on 04.05.2018, 19:36 and posted on 07.05.2018, 13:36 by Weikun Zhu, Erfan Mohammadi, Ying Diao
Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried out via image analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then employ this program in a case study of meniscus-guided coating of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C8-BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C8-BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms.

History

Email Address of Submitting Author

yingdiao@illinois.edu

Email Address(es) for Other Author(s)

wzhu29@illinois.edu, emohmmd2@illinois.edu

Institution

University of Illinois at Urbana−Champaign

Country

United States

ORCID For Submitting Author

0000-0002-8984-0051

Declaration of Conflict of Interest

None

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Read the published paper

in Journal of Polymer Science Part B: Polymer Physics

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