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Peak Force Visible Microscopy for Determination of Exciton Diffusion Length in Organic Photovoltaic Blends

preprint
submitted on 12.09.2018, 15:23 and posted on 13.09.2018, 20:07 by Haomin Wang, Le Wang, Yuequn Shang, Zhijun Ning, Xiaoji Xu
In this article, we developed a new nano spectroscopic technique, peak force visible (PF-vis) microscopy, which is based on the peak force tapping mode in an atomic force microscope to both visualize nanoscale morphology and estimate exciton diffusion lengths of donor domains in organic photovoltaic blends. Nano phase-separations in P3HT:PCBM and TFB:PCBM blend films were clearly revealed by PF-vis microscopy with a high spatial resolution less than 10 nm. A model that correlates PF-vis signal and the exciton diffusion length was also developed to estimate the diffusion lengths of P3HT and TFB to be 2.9±0.3 and 9.0±1.5 nm, respectively. PF-vis microscopy is expected to assist the evaluation of OPV materials, therefore accelerating the pace of innovation of OPVs.

Funding

Faculty Innovation Grant from Lehigh University

History

Email Address of Submitting Author

haw515@lehigh.edu

Institution

Lehigh University

Country

the United States

ORCID For Submitting Author

0000-0001-7193-8651

Declaration of Conflict of Interest

no conflict of interest

Version Notes

This is the first version

Exports